摘要
By varying the arrangements of patterned sapphire substrates, the stress-induced bandgap widening of GaN-based epitaxial layers can be acquired. Photoluminescence and Raman results demonstrate a linear relationship of blue-shift with the increase of residual stress.
原文 | 英語 |
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文章編號 | AW1K.3 |
期刊 | Optics InfoBase Conference Papers |
出版狀態 | 已出版 - 2016 |
事件 | CLEO: Applications and Technology, CLEO AT 2016 - San Jose, 美國 持續時間: 05 06 2016 → 10 06 2016 |
文獻附註
Publisher Copyright:© OSA 2016.