GPU-based ATPG System by Scaling Memory Usage and Reducing Data Transfer

Hua Ren Li, Hsing Chung Liang

研究成果: 圖書/報告稿件的類型會議稿件同行評審

摘要

Test generation and fault simulation are essential in VLSI automatic test pattern generation (ATPG). Parallel computing on GPU gives another way to improve work performance. Thousands of concurrent threads can be launched simultaneously within GPU. Due to severe GPU memory limitation, scalability algorithm and efficient data transfer are necessary for test generation and fault simulation. In this paper, we present a GPU-based ATPG system that can scale memory usage and reduce data transfer between processors. We utilize several parallelism methods to enhance the system ability. Comparing to a commercial tool run with CPU in single, two, four, and eight cores, experiments show that our algorithm has 3.99, 2.18, 1.17 and 0.94 times of speedup and 0.85, 0.78, 0.76 and 0.73 times of less memory usage, respectively.

原文英語
主出版物標題Proceedings - 2021 IEEE European Test Symposium, ETS 2021
發行者Institute of Electrical and Electronics Engineers Inc.
ISBN(電子)9781665418492
DOIs
出版狀態已出版 - 24 05 2021
對外發佈
事件26th IEEE European Test Symposium, ETS 2021 - Virtual, Bruges, 比利時
持續時間: 24 05 202128 05 2021

出版系列

名字Proceedings of the European Test Workshop
2021-May
ISSN(列印)1530-1877
ISSN(電子)1558-1780

Conference

Conference26th IEEE European Test Symposium, ETS 2021
國家/地區比利時
城市Virtual, Bruges
期間24/05/2128/05/21

文獻附註

Publisher Copyright:
© 2021 IEEE.

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