摘要
Test generation and fault simulation are essential in VLSI automatic test pattern generation (ATPG). Parallel computing on GPU gives another way to improve work performance. Thousands of concurrent threads can be launched simultaneously within GPU. Due to severe GPU memory limitation, scalability algorithm and efficient data transfer are necessary for test generation and fault simulation. In this paper, we present a GPU-based ATPG system that can scale memory usage and reduce data transfer between processors. We utilize several parallelism methods to enhance the system ability. Comparing to a commercial tool run with CPU in single, two, four, and eight cores, experiments show that our algorithm has 3.99, 2.18, 1.17 and 0.94 times of speedup and 0.85, 0.78, 0.76 and 0.73 times of less memory usage, respectively.
原文 | 英語 |
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主出版物標題 | Proceedings - 2021 IEEE European Test Symposium, ETS 2021 |
發行者 | Institute of Electrical and Electronics Engineers Inc. |
ISBN(電子) | 9781665418492 |
DOIs | |
出版狀態 | 已出版 - 24 05 2021 |
對外發佈 | 是 |
事件 | 26th IEEE European Test Symposium, ETS 2021 - Virtual, Bruges, 比利時 持續時間: 24 05 2021 → 28 05 2021 |
出版系列
名字 | Proceedings of the European Test Workshop |
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卷 | 2021-May |
ISSN(列印) | 1530-1877 |
ISSN(電子) | 1558-1780 |
Conference
Conference | 26th IEEE European Test Symposium, ETS 2021 |
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國家/地區 | 比利時 |
城市 | Virtual, Bruges |
期間 | 24/05/21 → 28/05/21 |
文獻附註
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