摘要
Transition metal dichalcogenides such as the semiconductor MoS2 are a class of two-dimensional crystals. The surface morphology and quality of MoS2 grown by chemical vapor deposition are examined using atomic force and scanning tunneling microscopy techniques. By analyzing the moiré patterns from several triangular MoS2 islands, we find that there exist at least five different superstructures and that the relative rotational angles between the MoS2 adlayer and graphite substrate lattices are typically less than 3°. We conclude that since MoS2 grows at graphite step-edges, it is the edge structure which controls the orientation of the islands, with those growing from zig-zag (or armchair) edges tending to orient with one lattice vector parallel (perpendicular) to the step-edge.
| 原文 | 英語 |
|---|---|
| 文章編號 | 181904 |
| 期刊 | Applied Physics Letters |
| 卷 | 106 |
| 發行號 | 18 |
| DOIs | |
| 出版狀態 | 已出版 - 04 05 2015 |
| 對外發佈 | 是 |
文獻附註
Publisher Copyright:© 2015 Author(s).
指紋
深入研究「Graphite edge controlled registration of monolayer MoS2 crystal orientation」主題。共同形成了獨特的指紋。引用此
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