摘要
Graph processing has attracted a lot of interests in recent years as it plays a key role to analyze huge datasets. ReRAM-based accelerators provide a promising solution to accelerate graph processing. However, the intrinsic stochastic behavior of ReRAM devices makes its computation results unreliable. In this paper, we build a simulation platform to analyze the impact of non-ideal ReRAM devices on the error rates of various graph algorithms. We show that the characteristic of the targeted graph algorithm and the type of ReRAM computations employed greatly affect the error rates. Using representative graph algorithms as case studies, we demonstrate that our simulation platform can guide chip designers to select better design options and develop new techniques to improve reliability.
| 原文 | 英語 |
|---|---|
| 主出版物標題 | Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020 |
| 編輯 | Giorgio Di Natale, Cristiana Bolchini, Elena-Ioana Vatajelu |
| 發行者 | Institute of Electrical and Electronics Engineers Inc. |
| 頁面 | 1478-1483 |
| 頁數 | 6 |
| ISBN(電子) | 9783981926347 |
| DOIs | |
| 出版狀態 | 已出版 - 03 2020 |
| 對外發佈 | 是 |
| 事件 | 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020 - Grenoble, 法國 持續時間: 09 03 2020 → 13 03 2020 |
出版系列
| 名字 | Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020 |
|---|---|
| ISSN(列印) | 1530-1591 |
Conference
| Conference | 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020 |
|---|---|
| 國家/地區 | 法國 |
| 城市 | Grenoble |
| 期間 | 09/03/20 → 13/03/20 |
文獻附註
Publisher Copyright:© 2020 EDAA.
指紋
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