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GraphRSim: A Joint Device-Algorithm Reliability Analysis for ReRAM-based Graph Processing

  • Chin Fu Nien
  • , Yi Jou Hsiao
  • , Hsiang Yun Cheng
  • , Cheng Yu Wen
  • , Ya Cheng Ko
  • , Che Ching Lin
  • Academia Sinica Taiwan HQ
  • National Yang Ming Chiao Tung University
  • National Taiwan University

研究成果: 圖書/報告稿件的類型會議稿件同行評審

8 引文 斯高帕斯(Scopus)

摘要

Graph processing has attracted a lot of interests in recent years as it plays a key role to analyze huge datasets. ReRAM-based accelerators provide a promising solution to accelerate graph processing. However, the intrinsic stochastic behavior of ReRAM devices makes its computation results unreliable. In this paper, we build a simulation platform to analyze the impact of non-ideal ReRAM devices on the error rates of various graph algorithms. We show that the characteristic of the targeted graph algorithm and the type of ReRAM computations employed greatly affect the error rates. Using representative graph algorithms as case studies, we demonstrate that our simulation platform can guide chip designers to select better design options and develop new techniques to improve reliability.

原文英語
主出版物標題Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020
編輯Giorgio Di Natale, Cristiana Bolchini, Elena-Ioana Vatajelu
發行者Institute of Electrical and Electronics Engineers Inc.
頁面1478-1483
頁數6
ISBN(電子)9783981926347
DOIs
出版狀態已出版 - 03 2020
對外發佈
事件2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020 - Grenoble, 法國
持續時間: 09 03 202013 03 2020

出版系列

名字Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020
ISSN(列印)1530-1591

Conference

Conference2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020
國家/地區法國
城市Grenoble
期間09/03/2013/03/20

文獻附註

Publisher Copyright:
© 2020 EDAA.

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