摘要
A new high-speed charge transfer sense amplifier scheme is proposed for 0.5V DRAM array applications. The combination of both the cross-coupled structure and the boosting capacitance used in the proposed sense amplifier leads to a maximum voltage difference between sense nodes. Based on post-layout simulations, the charge transfer speed and the voltage difference after charge transfer are improved 40.7% and 59.29%, respectively, over the prior art circuits. The power-delay product is then enhanced 38.26%. Besides, both high voltage pre-charge levels and high voltage control signals are not required in this proposed circuit as compared with prior arts.
| 原文 | 英語 |
|---|---|
| 頁(從 - 到) | 165-171 |
| 頁數 | 7 |
| 期刊 | International Journal of Electronics |
| 卷 | 96 |
| 發行號 | 2 |
| DOIs | |
| 出版狀態 | 已出版 - 02 2009 |
指紋
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