ICMAT 2011 - Reliability and variability of semiconductor devices and ICs

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研究成果: 期刊稿件 › 社論

原文	英語
頁（從 - 到）	1531
頁數	1
期刊	Microelectronics Reliability
卷	52
發行號	8
DOIs	https://doi.org/10.1016/j.microrel.2012.05.003
出版狀態	已出版 - 08 2012
對外發佈	是

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@article{8bf19796159c434e974170b98a651d42,

title = "ICMAT 2011 - Reliability and variability of semiconductor devices and ICs",

author = "Asen Asenov and Ulf Schlichtmann and Tan, \{Cher Ming\} and Hei Wong and Xing Zhou",

year = "2012",

month = aug,

doi = "10.1016/j.microrel.2012.05.003",

language = "英语",

volume = "52",

pages = "1531",

journal = "Microelectronics Reliability",

issn = "0026-2714",

publisher = "Elsevier Ltd",

number = "8",

}

TY - JOUR

T1 - ICMAT 2011 - Reliability and variability of semiconductor devices and ICs

AU - Asenov, Asen

AU - Schlichtmann, Ulf

AU - Tan, Cher Ming

AU - Wong, Hei

AU - Zhou, Xing

PY - 2012/8

Y1 - 2012/8

UR - https://www.scopus.com/pages/publications/84863724160

U2 - 10.1016/j.microrel.2012.05.003

DO - 10.1016/j.microrel.2012.05.003

M3 - 社论

AN - SCOPUS:84863724160

SN - 0026-2714

VL - 52

SP - 1531

JO - Microelectronics Reliability

JF - Microelectronics Reliability

IS - 8

ER -