Identifying Untestable Faults in Sequential Circuits

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26 引文斯高帕斯（Scopus）

原文	英語
頁（從 - 到）	14-23
頁數	10
期刊	IEEE Design and Test of Computers
卷	12
發行號	3
DOIs	https://doi.org/10.1109/MDT.1995.466367
出版狀態	已出版 - 1995
對外發佈	是

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title = "Identifying Untestable Faults in Sequential Circuits",

author = "Liang, \{Hsing Chung\} and Lee, \{Chung Len\} and Chen, \{Jwu E.\}",

year = "1995",

doi = "10.1109/MDT.1995.466367",

language = "英语",

volume = "12",

pages = "14--23",

journal = "IEEE Design and Test of Computers",

issn = "0740-7475",

publisher = "IEEE Computer Society",

number = "3",

}

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T1 - Identifying Untestable Faults in Sequential Circuits

AU - Liang, Hsing Chung

AU - Lee, Chung Len

AU - Chen, Jwu E.

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DO - 10.1109/MDT.1995.466367

M3 - 文章

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SN - 0740-7475

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