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Improvement of electrostatic discharge protection by introducing a spindt-type silicon field emission device

  • Liann Be Chang
  • , Yi Cherng Ferng*
  • , Jhong Wei Liao
  • , Ching Chi Lin
  • *此作品的通信作者
  • Chang Gung University

研究成果: 期刊稿件文章同行評審

1 引文 斯高帕斯(Scopus)

摘要

In this paper, an original Spindt-type silicon field emission device (FED) with electrostatic discharge (ESD) regulation capability is proposed. The fabricated FED characteristics, including process parameters, capacitance-voltage (C-V), current-voltage (I-V), and frequency response, are investigated. To verify its capability of ESD protection, we replace the metal oxide varistor (MOV) in a state-of-the-art protection configuration with the fabricated FED under the application conditions of system-level ESD tests. The measured results show that the proposed ESD protection circuit composed of a prestage gas arrestor, an intermediate resistor, and an introduced FED can suppress an injected ESD pulse voltage of 6000 to 3193 V, a reduction of 46.8%, whereas suppression is to 5606 V, a reduction of 6.57%, when using only a gas arrestor.

原文英語
文章編號044103
期刊Japanese Journal of Applied Physics
51
發行號4 PART 1
DOIs
出版狀態已出版 - 04 2012

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