摘要
In this paper, an original Spindt-type silicon field emission device (FED) with electrostatic discharge (ESD) regulation capability is proposed. The fabricated FED characteristics, including process parameters, capacitance-voltage (C-V), current-voltage (I-V), and frequency response, are investigated. To verify its capability of ESD protection, we replace the metal oxide varistor (MOV) in a state-of-the-art protection configuration with the fabricated FED under the application conditions of system-level ESD tests. The measured results show that the proposed ESD protection circuit composed of a prestage gas arrestor, an intermediate resistor, and an introduced FED can suppress an injected ESD pulse voltage of 6000 to 3193 V, a reduction of 46.8%, whereas suppression is to 5606 V, a reduction of 6.57%, when using only a gas arrestor.
| 原文 | 英語 |
|---|---|
| 文章編號 | 044103 |
| 期刊 | Japanese Journal of Applied Physics |
| 卷 | 51 |
| 發行號 | 4 PART 1 |
| DOIs | |
| 出版狀態 | 已出版 - 04 2012 |
指紋
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