Influence of electrodeposition potential and heat treatment on structural properties of CdTe films

Shu Ying Yang; Jung Chuan Chou; Herng Yih Ueng

doi:10.1016/j.tsf.2009.12.077

Influence of electrodeposition potential and heat treatment on structural properties of CdTe films

Shu Ying Yang, Jung Chuan Chou, Herng Yih Ueng^*

^*此作品的通信作者

研究成果: 期刊稿件 › 文章 › 同行評審

25 引文斯高帕斯（Scopus）

摘要

A modified Butler-Volmer model is developed to predict the potential of perfect stoichiometry (PPS) for electrodeposition. CdTe thin films are deposited in an acidic solution; their electrodeposition mechanism is investigated using cyclic voltammetry. Calculated and experimental PPS values exhibit good agreement. At PPS, well-connected granular CdTe thin films can be deposited; these are predicted to be intrinsic, and slightly p-type due to cadmium vacancies. Type conversion occurs only because of defect redistribution and local defect reactions after annealing; the converted n-type layer exhibits lower resistivity and higher mobility. A film annealed at 350 °C exhibits excellent crystallization.

原文	英語
頁（從 - 到）	4197-4202
頁數	6
期刊	Thin Solid Films
卷	518
發行號	15
DOIs	https://doi.org/10.1016/j.tsf.2009.12.077
出版狀態	已出版 - 31 05 2010
對外發佈	是

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title = "Influence of electrodeposition potential and heat treatment on structural properties of CdTe films",

abstract = "A modified Butler-Volmer model is developed to predict the potential of perfect stoichiometry (PPS) for electrodeposition. CdTe thin films are deposited in an acidic solution; their electrodeposition mechanism is investigated using cyclic voltammetry. Calculated and experimental PPS values exhibit good agreement. At PPS, well-connected granular CdTe thin films can be deposited; these are predicted to be intrinsic, and slightly p-type due to cadmium vacancies. Type conversion occurs only because of defect redistribution and local defect reactions after annealing; the converted n-type layer exhibits lower resistivity and higher mobility. A film annealed at 350 °C exhibits excellent crystallization.",

keywords = "Cadmium telluride, Cyclic voltammetry, Electrodeposition, Potentiostat, Scanning electron microscopy, Stoichiometry, X-ray diffraction",

author = "Yang, {Shu Ying} and Chou, {Jung Chuan} and Ueng, {Herng Yih}",

year = "2010",

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doi = "10.1016/j.tsf.2009.12.077",

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T1 - Influence of electrodeposition potential and heat treatment on structural properties of CdTe films

AU - Yang, Shu Ying

AU - Chou, Jung Chuan

AU - Ueng, Herng Yih

PY - 2010/5/31

Y1 - 2010/5/31

N2 - A modified Butler-Volmer model is developed to predict the potential of perfect stoichiometry (PPS) for electrodeposition. CdTe thin films are deposited in an acidic solution; their electrodeposition mechanism is investigated using cyclic voltammetry. Calculated and experimental PPS values exhibit good agreement. At PPS, well-connected granular CdTe thin films can be deposited; these are predicted to be intrinsic, and slightly p-type due to cadmium vacancies. Type conversion occurs only because of defect redistribution and local defect reactions after annealing; the converted n-type layer exhibits lower resistivity and higher mobility. A film annealed at 350 °C exhibits excellent crystallization.

AB - A modified Butler-Volmer model is developed to predict the potential of perfect stoichiometry (PPS) for electrodeposition. CdTe thin films are deposited in an acidic solution; their electrodeposition mechanism is investigated using cyclic voltammetry. Calculated and experimental PPS values exhibit good agreement. At PPS, well-connected granular CdTe thin films can be deposited; these are predicted to be intrinsic, and slightly p-type due to cadmium vacancies. Type conversion occurs only because of defect redistribution and local defect reactions after annealing; the converted n-type layer exhibits lower resistivity and higher mobility. A film annealed at 350 °C exhibits excellent crystallization.

KW - Cadmium telluride

KW - Cyclic voltammetry

KW - Electrodeposition

KW - Potentiostat

KW - Scanning electron microscopy

KW - Stoichiometry

KW - X-ray diffraction

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U2 - 10.1016/j.tsf.2009.12.077

DO - 10.1016/j.tsf.2009.12.077

M3 - 文章

AN - SCOPUS:77953148912

SN - 0040-6090

VL - 518

SP - 4197

EP - 4202

JO - Thin Solid Films

JF - Thin Solid Films

IS - 15

ER -

Influence of electrodeposition potential and heat treatment on structural properties of CdTe films

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