Investigate the equivalence of neutrons and protons in single event effects testing: A Geant4 study

Yueh Chiang, Cher Ming Tan*, Tsi Chian Chao, Chung Chi Lee, Chuan Jong Tung

*此作品的通信作者

研究成果: 期刊稿件文章同行評審

5 引文 斯高帕斯(Scopus)

摘要

Neutron radiation on advanced integrated circuits (ICs) is becoming important for their reliable operation. However, a neutron test on ICs is expensive and time-consuming. In this work, we employ Monte Carlo simulation to examine if a proton test can replace or even accelerate the neutron test, and we found that 200 MeV protons are the closest to resembling neutron radiation with five main differences. This 200 MeV concur with the suggestion from National Aeronautics and Space Administration (NASA,Washington, DC, USA). However, the impacts of the five differences on single event effects (SEEs) require future work for examination.

原文英語
文章編號3234
期刊Applied Sciences (Switzerland)
10
發行號9
DOIs
出版狀態已出版 - 01 05 2020

文獻附註

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© 2020 by the authors.

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