Investigation of nano-sized hole/post patterned sapphire substrates-induced strain-related quantum-confined stark effect of ingan-based light-emitting diodes
Vincent Su, Po Hsun Chen, Ming Lun Lee, Yao Hong You, Cheng Ju Hsieh, Chieh Hsiung Kuan*, Yi Chi Chen, Hung Chou Lin, Han Bo Yang, Ray Ming Lin, Quan Yi Lee, Fu Chuan Chu
*此作品的通信作者
研究成果: 圖書/報告稿件的類型 › 會議稿件 › 同行評審
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引文
斯高帕斯(Scopus)