Investigation of the reliability of nano-nickel/niobium oxide-based multilayer thin films deposited on polymer substrates for flexible electronic applications

Rahul Sahay*, Yen Cheng Tu, Izzat Aziz, Arief S. Budiman*, Cher Ming Tan, Pooi See Lee, Olivier Thomas, Nagarajan Raghavan*

*此作品的通信作者

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Engineering

Material Science