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Junction temperature measurement of light-emitting diodes by voltage-temperature relation method

  • Y. K. Yang
  • , W. C. Lien
  • , Y. C. Huang
  • , N. C. Chen*
  • *此作品的通信作者
  • Chang Gung University

研究成果: 圖書/報告稿件的類型會議稿件同行評審

1 引文 斯高帕斯(Scopus)

摘要

The voltage-temperature relation of a light-emitting diode is adopted to determine the junction temperature. This study compares two different methods for junction temperature measurement. Both methods yield results are consistent with the largest difference being only 3.5K.

原文英語
主出版物標題Conference on Lasers and Electro-Optics/Pacific Rim, CLEOPR 2007
發行者Optical Society of America
ISBN(列印)1424411742, 9781424411740
出版狀態已出版 - 2007
事件Conference on Lasers and Electro-Optics/Pacific Rim, CLEOPR 2007 - Seoul, 韓國
持續時間: 26 08 200726 08 2007

出版系列

名字Optics InfoBase Conference Papers
ISSN(電子)2162-2701

Conference

ConferenceConference on Lasers and Electro-Optics/Pacific Rim, CLEOPR 2007
國家/地區韓國
城市Seoul
期間26/08/0726/08/07

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