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Machine Vision Observation, Artificial Intelligence Pattern Recognition, Protective Circuit Design, Characterization of Multiple Materials, and Nano-Structural Analysis for Investigating InGaN Green Light Emitting Diode Degradation in a Salty Water Vapor Environment

  • Cheng Shan Chen
  • , Chun Yen Yang
  • , Shao Jui Yang
  • , Deng Yi Wang
  • , Yaw Wen Kuo
  • , Wei Han Hsiao
  • , Hsin Hung Chou
  • , Chia Feng Lin
  • , Yung Hui Li
  • , Yewchung Sermon Wu
  • , Hsiang Chen*
  • , Jung Han
  • *此作品的通信作者
  • National Yang Ming Chiao Tung University
  • National Chi Nan University
  • National Chung Hsing University
  • Hon Hai Precision Industry
  • Yale University

研究成果: 圖書/報告稿件的類型會議稿件同行評審

5 引文 斯高帕斯(Scopus)

摘要

This study delves into the degradation of GaN-based LEDs in saline environments, a relatively underexplored area of research. LEDs are known for their longevity, but face challenges under extreme conditions. Utilizing artificial intelligence, machine vision, and material analysis, this study detects early signs of LED degradation[1], [2]. The results highlight the impact of saline exposure on LED performance, with some LEDs continuing to function for up to 30 minutes before failure. Advanced circuits ensure uninterrupted operation. Encompassing electrical engineering, computer science, and materials science, this study provides a comprehensive approach to LED fault detection and protection.

原文英語
主出版物標題2024 IEEE International Reliability Physics Symposium, IRPS 2024 - Proceedings
發行者Institute of Electrical and Electronics Engineers Inc.
ISBN(電子)9798350369762
DOIs
出版狀態已出版 - 2024
事件2024 IEEE International Reliability Physics Symposium, IRPS 2024 - Grapevine, 美國
持續時間: 14 04 202418 04 2024

出版系列

名字IEEE International Reliability Physics Symposium Proceedings
ISSN(列印)1541-7026

Conference

Conference2024 IEEE International Reliability Physics Symposium, IRPS 2024
國家/地區美國
城市Grapevine
期間14/04/2418/04/24

文獻附註

Publisher Copyright:
© 2024 IEEE.

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