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Morphology evolution of nano-structured InN grown by MOMBE
Shou Yi Kuo
, Wei Chun Chen, Jui Fu Yang, Chien Nan Hsiao, Fang I. Lai
*
*
此作品的通信作者
電子工程學系(含學碩博士班)
National Applied Research Laboratories Taiwan
Chang Gung University
Yuan Ze University
National Cheng Kung University
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引文 斯高帕斯(Scopus)
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重量
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Material Science
Temperature
100%
Morphology
100%
Surface Morphology
66%
Electrical Property
66%
Sapphire
66%
Aluminum Nitride
66%
Nitride Compound
33%
Surface
33%
X-Ray Diffraction
33%
Scanning Electron Microscopy
33%
Buffer Layer
33%
Structural Property
33%
Atomic Force Microscopy
33%
Transmission Electron Microscopy
33%
Indium
33%
Residual Stress
33%
Molecular Beam Epitaxy
33%
Lattice Mismatch
33%
Biochemistry, Genetics and Molecular Biology
Growth
100%
Morphology
100%
Evolution
100%
Temperature
37%
Surface Property
37%
Flow Rate
25%
Thickness
12%
X Ray Diffraction
12%
Stress
12%
Physics
Growth
100%
Temperature
37%
Electrical Properties
37%
Substrates
25%
Independent Variables
25%
Flow Velocity
25%
Photoelectric Emission
12%
Scanning Electron Microscopy
12%
Nitride
12%
Transmission Electron Microscopy
12%
X Ray Diffraction
12%
Transport Properties
12%
Island
12%
Indium
12%
Atomic Force Microscopy
12%
Lattice Mismatch
12%
Molecular Beam Epitaxy
12%