摘要
Nitride light-emitting diodes (LEDs) are grown on a Si (111) substrate with a TiN template. Transmission electron microscopy and x-ray diffraction indicate that the epitaxial relation follows Si (1,1,1) ∥TiN (1,1,1) ∥AlN (0,0,1), Si [1,1,0] ∥TiN [1,1,0], and Si [0,0,1] ∥TiN [0,0,1]. The reflectance measurement and simulation results indicate that the TiN can be adopted as a reflector to mitigate the substrate absorption problem, thus increasing the extraction efficiency of nitride LEDs grown on Si.
| 原文 | 英語 |
|---|---|
| 文章編號 | 191110 |
| 期刊 | Applied Physics Letters |
| 卷 | 88 |
| 發行號 | 19 |
| DOIs | |
| 出版狀態 | 已出版 - 2006 |
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