摘要
In this study, solution-based indium-znic-oxide (IZO) thin-film transistors (TFTs) with a photoresist protected structure using halftone technology are demonstrated. A halftone technology to produced two thickness photo-resist on IZO TFT device to protect channel region and improve the contact characteristics between IZO and S/D electrode simultaneously during plasma and etching process. The saturation field effect mobility of about 0.18 cm2/Vs, the current ON/OFF ratio is about 106, and the threshold voltage is less than 3.0 V. The solution type IZO associated with photo-resist protected layer shows great potential in TFT LCD fabrication.
原文 | 英語 |
---|---|
頁(從 - 到) | 1-8 |
頁數 | 8 |
期刊 | Advances in Information Sciences and Service Sciences |
卷 | 4 |
發行號 | 20 |
DOIs | |
出版狀態 | 已出版 - 11 2012 |