Pre-diagnosis of Failure Spots in Orange AlInGaP Light-Emitting Diodes Soaked in Liquid Nitrogen Using Machine Vision and Multiple Optical, Electrical, and Material Characterizations

  • Chyuan Haur Kao
  • , Yu Chang Zang
  • , Jia Jie Jhang
  • , Pin En Chiu
  • , Chun Yen Yang
  • , Hai Wen Hsu
  • , Yaw Wen Kuo
  • , Chia Feng Lin
  • , Ming Yu Kuo
  • , Yung Hui Li
  • , Ming Hsien Li*
  • , Hsiang Chen
  • , Jung Han
  • *此作品的通信作者

研究成果: 期刊稿件文章同行評審

4 引文 斯高帕斯(Scopus)

摘要

In this study, Pre-diagnosis of degraded aluminum indium gallium phosphide (AlInGaP) light-emitting diodes (LEDs) that were soaked in liquid nitrogen (LN2) was performed. To visualize the early deterioration of LED emission, a combination of material, electrical, optical, and computer-aided machine-vision analysis of LED failure spots on the surface was examined. Results indicate that several small failure spots, which can be identified by the MATLAB processed emission images and surface roughness variation, can be found. Furthermore, LN2 soaking induced some local damages inside the device that penetrate the multiple-quantum well. The decrease of current and luminescence intensity also reflects the gradual degradation of the device after being soaked in LN2. This integrated analysis and Pre-diagnosis of the degraded device provided early screening of LED failure spots and real-time inspection during operations.

原文英語
頁(從 - 到)4386-4391
頁數6
期刊IEEE Transactions on Electron Devices
69
發行號8
DOIs
出版狀態已出版 - 01 08 2022

文獻附註

Publisher Copyright:
© 1963-2012 IEEE.

指紋

深入研究「Pre-diagnosis of Failure Spots in Orange AlInGaP Light-Emitting Diodes Soaked in Liquid Nitrogen Using Machine Vision and Multiple Optical, Electrical, and Material Characterizations」主題。共同形成了獨特的指紋。

引用此