Prevention of information leakage by photo-coupling in smart card

Sung Shiou Shen*, Jung Hui Chiu

*此作品的通信作者

研究成果: 期刊稿件文章同行評審

1 引文 斯高帕斯(Scopus)

摘要

Advances in smart card technology encourages smart card use in more sensitive applications, such as storing important information and securing application. Smart cards are however vulnerable to side channel attacks. Power consumption and electromagnetic radiation of the smart card can leak information about the secret data protected by the smart card. Our paper describes two possible hardware countermeasures that protect against side channel information leakage. We show that power analysis can be prevented by adopting photo-coupling techniques. This method involves the use of LED with photovoltaic cells and photo-couplers on the power, reset, I/O and clock lines of the smart card. This method reduces the risk of internal data bus leakage on the external data lines. Moreover, we also discuss the effectiveness of reducing electromagnetic radiation by using embedded metal plates.

原文英語
頁(從 - 到)160-167
頁數8
期刊IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
E91-A
發行號1
DOIs
出版狀態已出版 - 2008

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