Reliability Perspective on the IoT and Nanoelectronics

研究成果: 圖書/報告稿件的類型會議稿件同行評審

2 引文 斯高帕斯(Scopus)

摘要

Internet of Things (IoT) is coming strongly and we have no escape to it. While current technology and its development can indeed make IoT a reality, its cost has to be much lower and at the same time its reliability must be very high. Furthermore, the necessity of nano-electronics in IoT presents new degradation mechanisms that need to be studied in detail. Thus, it is a huge challenge in reliability field in anticipation of IoT era. This work presents some critical issues and highlight some works that are being done to meet the coming challenges.

原文英語
主出版物標題2018 IEEE 8th International Nanoelectronics Conferences, INEC 2018
發行者Institute of Electrical and Electronics Engineers Inc.
頁面1-2
頁數2
ISBN(列印)9781538642504
DOIs
出版狀態已出版 - 20 08 2018
事件8th IEEE International Nanoelectronics Conferences, INEC 2018 - Kuala Lumpur, 馬來西亞
持續時間: 03 01 201805 01 2018

出版系列

名字2018 IEEE 8th International Nanoelectronics Conferences, INEC 2018

Conference

Conference8th IEEE International Nanoelectronics Conferences, INEC 2018
國家/地區馬來西亞
城市Kuala Lumpur
期間03/01/1805/01/18

文獻附註

Publisher Copyright:
© 2018 IEEE.

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