Retention behavior of graphene oxide resistive switching memory on flexible substrate

Fang Yuan*, Yu Ren Ye, Jer Chyi Wang, Zhigang Zhang, Liyang Pan, Jun Xu, Chao Sung Lai

*此作品的通信作者

研究成果: 圖書/報告稿件的類型會議稿件同行評審

7 引文 斯高帕斯(Scopus)

摘要

This work presents a flexible carbon based memory with the Al/graphene oxide (GO)/ITO structure fabricated at room temperature. The Al/GO/ITO devices show the unipolar resistive switching behavior with the resistance ratio to over 30, and sustain over 250 cycling without any resistance window closure. However, the retention fails due to the resistance increase of low resistance state (LRS). The mechanisms of switching and retention failure are studied.

原文英語
主出版物標題Proceedings of the 2013 IEEE 5th International Nanoelectronics Conference, INEC 2013
頁面288-290
頁數3
DOIs
出版狀態已出版 - 2013
事件2013 IEEE 5th International Nanoelectronics Conference, INEC 2013 - Singapore, 新加坡
持續時間: 02 01 201304 01 2013

出版系列

名字Proceedings - Winter Simulation Conference
ISSN(列印)0891-7736

Conference

Conference2013 IEEE 5th International Nanoelectronics Conference, INEC 2013
國家/地區新加坡
城市Singapore
期間02/01/1304/01/13

指紋

深入研究「Retention behavior of graphene oxide resistive switching memory on flexible substrate」主題。共同形成了獨特的指紋。

引用此