Room temperature observation of point defect on gold surface using thermovoltage mapping

Arijit Roy*, Cher Ming Tan, Sean J. O'Shea, Kedar Hippalgaonkar, Wulf Hofbauer

*此作品的通信作者

研究成果: 期刊稿件文章同行評審

摘要

In this work, we apply thermovoltage imaging using scanning tunneling microscope to observe atomic scale surface imperfections at room temperature. Thermovoltage mapping can provide high resolution (down to 1 nm) images of standing waves in metal at room temperature, thus avoiding the need for low temperature scanning tunneling microscopy for the investigation of the standing waves. In order to generate a thermovoltage between the sample and tip, the sample (Au(1 1 1)) is heated to about 40 °C above the room temperature and surface scanning is performed. Heating the sample is simpler than heating the tip by laser irradiation. The thermovoltage technique can be applied to estimate surface defect density and the severity of the surface defects in materials, which can be a useful tool for the reliability study of nano-scale materials and devices.

原文英語
頁(從 - 到)1580-1584
頁數5
期刊Microelectronics Reliability
47
發行號9-11 SPEC. ISS.
DOIs
出版狀態已出版 - 08 2007
對外發佈

指紋

深入研究「Room temperature observation of point defect on gold surface using thermovoltage mapping」主題。共同形成了獨特的指紋。

引用此