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System matrix based on sensitivity model for small animal multi-pinhole SPECT system

  • Ho Hui Hsieh*
  • , Ching Han Hsu
  • , Greta S.P. Mok
  • , Yu Jung Tsai
  • , Shi Ing Chang
  • , Ing Tsung Hsiao
  • *此作品的通信作者
  • Chang Gung University
  • National Tsing Hua University
  • Chinese University of Hong Kong
  • Chang Gung Memorial Hospital

研究成果: 圖書/報告稿件的類型會議稿件同行評審

3 引文 斯高帕斯(Scopus)

摘要

High spatial resolution of multi-pinhole SPECT is often hampered by physical effects including collimator response, and pinhole edge penetration. The collimator response is related to the blurring effect varying with distance from source to the aperture, and caused by the non-ideal aperture diameter. Pinhole edge penetration is referred to penetration of gamma rays through the thin edge of the collimator, and leads to resolution degradation as well. Thus, to improve resolution, both effects of collimator response and pinhole penetration need to be corrected in the reconstruction. Here, a system model based on an analytical sensitivity model including both aperture response and penetration effect is proposed. The penetration effect is modeled by a penetration mask by re-distributing the analytical sensitivity for an analytical knife-edge multi-pinhole formula to the detector space. The penetration mask is analytically computed by attenuation path length through the aperture. This system model is then implemented into the iterative reconstruction on a stationary multi-pinhole SPECT system based on clinical three-head SPECT system. From the preliminary result, the new system model for iterative stationary mu I ti pinhole SPECT reconstruction showed promising in improving image resolution over the conventional ideal pinhole model for the stationary multipinhole SPECT.

原文英語
主出版物標題IEEE Nuclear Science Symposuim and Medical Imaging Conference, NSS/MIC 2010
頁面3308-3311
頁數4
DOIs
出版狀態已出版 - 2010
對外發佈
事件2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010 - Knoxville, TN, 美國
持續時間: 30 10 201006 11 2010

出版系列

名字IEEE Nuclear Science Symposium Conference Record
ISSN(列印)1095-7863

Conference

Conference2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010
國家/地區美國
城市Knoxville, TN
期間30/10/1006/11/10

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