The study of loss kinetics of current carriers in copper-indium-gallium selenide by microwave photoconductivity method

G. F. Novikov*, E. V. Rabenok, M. J. Jeng, L. B. Chang

*此作品的通信作者

研究成果: 期刊稿件文章同行評審

12 引文 斯高帕斯(Scopus)

摘要

This study investigated how stoichiometry affects processes associated with current carriers by undertaking a kinetics investigation of electron loss processes in the copper-indium-gallium selenide (CIGS) samples prepared by PVD and sol-gel methods. Owing to these processes, the current carriers generated by light can be trapped or recombined after a thermalization process and fail to reach electrodes during their lifetime and adversely impact the photovoltaic performance of solar elements. The microwave photoconductivity method provides an effective means of obtaining data on the lifetime and energy distribution of traps for current carriers. Experimental results indicate that the free electron lifetimes in the best samples prepared in both methods are approximately the same, yet decrease with a decline in stoichiometry.

原文英語
文章編號011604
期刊Journal of Renewable and Sustainable Energy
4
發行號1
DOIs
出版狀態已出版 - 01 01 2012

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