VLSI circuit design with built-in reliability using simulation techniques

The use of reliability assurance and enhancement of integrated circuits in the design of high-performance electronic systems is discussed. Circuit simulators with embedded degradation models can be utilized to accurately predict VLSI reliability due to hot-carrier effects and electromigration. Basic design methods for constructing digital and analog circuit blocks with adequate built-in reliability are presented. Lifetime for DRAM circuitries and operational amplifiers can be significantly increased through these novel simulation techniques. Several practical VLSI design examples using an integrated-circuit reliability simulator are discussed.